TSW14J59EVM

595-TSW14J59EVM
TSW14J59EVM

Mfr.:

Description:
Data Conversion IC Development Tools TSW14J59 evaluation module

Lifecycle:
End of Life:
Scheduled for obsolescence and will be discontinued by the manufacturer.
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In Stock: 8

Stock:
8 Can Dispatch Immediately
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Minimum: 1   Multiples: 1   Maximum: 5
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Pricing (INR)

Qty. Unit Price
Ext. Price
₹5,59,277.54 ₹5,59,277.54

Product Attribute Attribute Value Select Attribute
Texas Instruments
Product Category: Data Conversion IC Development Tools
Delivery Restrictions:
 This item may require additional fees and documentation. Customs delays may also occur.
RoHS:  
Evaluation Modules
Data Capture and Pattern Generator Card
Brand: Texas Instruments
Interface Type: USB
Product Type: Data Conversion IC Development Tools
Series: TSW14J59
Factory Pack Quantity: 1
Subcategory: Development Tools
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Attributes selected: 0

Compliance Codes
CNHTS:
8543709990
USHTS:
8473301180
TARIC:
8473302000
ECCN:
EAR99
Origin Classifications
Country of Origin:
United States
Assembly Country of Origin:
United States
Country of Diffusion:
Not available
The country is subject to change at the time of shipment.

TSW14J59EVM Evaluation Module (EVM)

Texas Instruments TSW14J59EVM Evaluation Module (EVM) is a next-generation pattern generator and data capture card used to evaluate performances of the current TI JESD204C_B device family of high-speed analog-to-digital converters (ADC) and digital-to-analog converters (DAC). For an ADC, by capturing the sampled data over a JESD204C_B interface when using a high-quality, low-jitter clock and a high-quality input frequency, the TSW14J59 can be used to demonstrate data sheet performance specifications. Using the Texas Instruments JESD201C IP core, the TSW14J59EVM can be dynamically configurable to support lane speeds from 1Gbps to 32Gbps, from 1 to 16 lanes. Together with the accompanying High-Speed Data Converter Pro Graphic User Interface (GUI), the TSW14J59EVM is a complete system that captures and evaluates data samples from the ADC evaluation module, generates and sends desired test patterns to DAC evaluation modules, and performs both tasks at the same time with AFE evaluation modules (transceiver mode).