TPS3424EVM

Texas Instruments
595-TPS3424EVM
TPS3424EVM

Mfr.:

Description:
Power Management IC Development Tools TPS3424 evaluation m odule

Lifecycle:
New Product:
New from this manufacturer.
This item may require additional fees and documentation. Customs delays may also occur.

In Stock: 7

Stock:
7 Can Dispatch Immediately
Factory Lead Time:
12 Weeks Estimated factory production time for quantities greater than shown.
Long lead time reported on this product.
Minimum: 1   Multiples: 1   Maximum: 5
Unit Price:
₹-.--
Ext. Price:
₹-.--
Est. Tariff:

Pricing (INR)

Qty. Unit Price
Ext. Price
₹16,896.33 ₹16,896.33

Product Attribute Attribute Value Select Attribute
Texas Instruments
Product Category: Power Management IC Development Tools
Delivery Restrictions:
 This item may require additional fees and documentation. Customs delays may also occur.
RoHS:  
Evaluation Modules
Power Management Specialized
1 V to 6 V
TPS3424, TPS3423
TPS3424
Brand: Texas Instruments
Maximum Operating Temperature: - 40 C
Minimum Operating Temperature: + 125 C
Packaging: Bulk
Product Type: Power Management IC Development Tools
Factory Pack Quantity: 1
Subcategory: Development Tools
Products found:
To show similar products, select at least one checkbox
Select at least one checkbox above to show similar products in this category.
Attributes selected: 0

Compliance Codes
USHTS:
8473301180
TARIC:
8473302000
ECCN:
EAR99
Origin Classifications
Country of Origin:
United States
Assembly Country of Origin:
Not available
Country of Diffusion:
Not available
The country is subject to change at the time of shipment.

TPS3424EVM Evaluation Module (EVM)

Texas Instruments TPS3424EVM Evaluation Module (EVM) evaluates the TPS3424 and TPS3423 push button controller family of ICs. The TPS3424EVM circuit board comes pre-installed with the TPS3424A11C13ADRL device for full functionality testing. This board provides a sample design and test point for all input and output pins of the Texas Instruments TPS3424 and TPS3423 devices to capture measurements and behavioral data for the devices.