Analog Devices Inc. AD4852 250kSPS Data Acquisition System (DAS)

Analog Devices AD4852 250kSPS Data Acquisition System (DAS) is a fully buffered, four‑channel, simultaneous‑sampling DAS that delivers 20‑bit resolution at throughput rates up to 250kSPS, with differential inputs supporting a wide common‑mode range. Powered from a 5V supply and equipped with flexible input buffer supplies, the ADI AD4852 device uses an internal low‑drift precision reference and reference buffer to enable SoftSpan operation, allowing each channel’s input range to be independently programmed to match the signal swing and reduce the need for external signal conditioning. To further enhance performance, the AD4852 incorporates seamless high dynamic range (SHDR) technology, which automatically optimizes channel gain on a sample‑by‑sample basis to minimize noise while preserving linearity.

With an 11MHz signal bandwidth, picoamp‑level input buffers, wide input common‑mode capability, and a high 120dB common‑mode rejection ratio (CMRR), the AD4852 can directly digitize signals with arbitrary differential swings. The device's high accuracy (characterized by ±160µV integral nonlinearity, no missing codes at 20 bits, 97.2dB signal‑to‑noise ratio, and 111.4dB dynamic range) makes the AD4852 well-suited for precision measurement applications. Optional 24‑bit oversampling further improves SNR and dynamic range, while per‑channel offset, gain, and phase adjustments allow system‑level calibration and error correction ahead of the converter.

The ADI AD4852 features a flexible SPI configuration interface operating from 0.9V to 5.25V and supports both LVDS and CMOS data outputs, selectable via a dedicated control pin. In CMOS mode, one to four data lines can be used to balance throughput and bus width requirements. Housed in a compact 7.00mm × 7.00mm, 64‑ball BGA package, the AD4852 integrates critical supply and reference bypass capacitors, reducing component count, PCB sensitivity, and overall solution size. This DAS is specified for reliable operation across an extended industrial temperature range of -40°C to +125°C.

Features

  • Complete 20-bit data acquisition system
    • Simultaneous sampling of four internally buffered channels
    • 250kSPS per channel throughput
    • Differential, wide common-mode range inputs
    • ±75pA typical input leakage at +25°C
    • <300ns full-scale input step settling time
    • Integrated reference and reference buffer (4.096V)
    • Integrated supply decoupling capacitors
    • 36mW per channel at 250kSPS, scales with throughput
  • Minimal external signal conditioning
  • Seamless high dynamic range
    • Per sample, per channel automatic gain ranging
    • Maintains ppm-level INL
  • Per channel SoftSpan input ranges, bipolar or unipolar
    • ±40V, ±25V, ±20V, ±12.5V, ±10V, ±6.25V, ±5V, and ±2.5V
    • 0V to 40V, 25V, 20V, 12.5V, 10V, 6.25V, 5V, and 2.5V
  • Rail-to-rail input overdrive tolerance
  • High performance
    • ±160μV typical INL (±40V range)
    • 97.2dB typical single-conversion SNR (±40V range)
    • 111.4dB typical single-conversion DR (±40V range)
    • -117dB typical THD (±40V range)
    • 120dB typical CMRR
  • Digital flexibility
    • SPI CMOS (0.9V to 5.25V) and LVDS serial input and output
    • Optional oversampling with 24-bit digital averaging
    • Optional offset, gain, and phase correction
  • 7.00mm × 7.00mm, 64-ball BGA full solution footprint

Applications

  • Automatic test equipment
  • Avionics and aerospace
  • Instrumentation and control systems
  • Semiconductor manufacturing
  • Test and measurement

Specifications

  • 20-bit minimum resolution
  • 7.25V to 48V power supply input range
  • Analog inputs
    • 120dB typical CMRR
    • 0mA to 10mA maximum input overdrive current tolerance range
    • ±40nA input leakage current range
    • 1000GΩ typical input resistance
    • 4pF typical input capacitance
  • 1ns typical aperture delay
  • 300ps typical aperture delay matching
  • 1ps RMS typical aperture jitter
  • 300ns typical full-scale input step settling time
  • Power dissipation
    • 443mW maximum CMOS conversion data output
    • 475mW maximum LVDS conversion data output
  • -40°C to +125°C operating temperature range
  • AC accuracy
    • 81.6dB to 97.9dB typical signal-to-noise-and-distortion (SINAD) ratio
    • 81.6dB to 97.9dB typical signal-to-noise (SNR) ratio
    • -117dB to -109dB typical total harmonic distortion (THD)
    • 111dB to 119dB typical spurious-free dynamic range (SFDR)
  • DC accuracy
    • 55µV to 725µV maximum INL error range
    • ±0.2LSB typical differential nonlinearity (DNL) error
    • 73µVRMS to 461µVRMS typical transition noise range
    • ±700µV zero-scale error
    • ±1.5µV/°C typical zero-scale error drift
    • ±0.035%FS full-scale error
    • ±1.5ppm/°C typical full-scale error drift

Functional Block Diagram

Block Diagram - Analog Devices Inc. AD4852 250kSPS Data Acquisition System (DAS)
Published: 2026-03-16 | Updated: 2026-03-20