Texas Instruments TRF0108SEP/SP Evaluation Modules

Texas Instruments TRF0108SEP/SP Evaluation Modules provide a complete platform for evaluating TRF0108‑SEP and TRF0108‑SP high-performance RF amplifiers. The devices perform differential-to-single-ended (D2S) conversion, facilitating designers to interface differential DAC outputs with single-ended RF systems across wide frequency ranges.

The TRF0108SP-EVM supports radiation-hardness-assured (RHA) applications, while the TRF0108SEP-EVM supports radiation-tolerant designs. The TI TRF0108SEP/SP Evaluation Modules are optimized for DAC-driven applications requiring wideband D2S conversion, offering AC-coupled signal paths, broadband impedance matching, and SMA connector interfaces for ease of RF testing.

The EVMs support straightforward bench evaluation with a +5V supply and standard RF test equipment. The TRF0108SEP/SP Evaluation Modules feature 100Ω differential-input matching and 50Ω single-ended outputs, enabling efficient characterization of gain, linearity, noise, and frequency response up to 12GHz.

Features

  • Based on TRF0108-SP and TRF0108-SEP differential-to-single-ended RF amplifiers
  • TRF0108SP-EVM radiation-hardness-assured and TRF0108SEP-EVM radiation-tolerant options
  • AC-coupled input and output signal paths
  • Differential input matching of 100Ω and single-ended output matching of 50Ω
  • SMA connector interfaces for RF input and output connections
  • Onboard power-down control via jumper configuration

Applications

  • DAC-to-RF signal chain evaluation
  • Wideband RF amplifier testing and characterization
  • Aerospace and defense RF systems
  • High-frequency signal processing and instrumentation

Specifications

  • Frequency support for RF evaluation up to 12GHz
  • Typical supply current of approximately 170mA during operation

Required Equipment

  • +5V bench power supply with current limiting
  • RF signal generator with differential drive support via balun
  • Spectrum analyzer or vector network analyzer

Single-Tone Setup for Gain & Output P1dB

Application Circuit Diagram - Texas Instruments TRF0108SEP/SP Evaluation Modules

S-Parameter Test Setup

Application Circuit Diagram - Texas Instruments TRF0108SEP/SP Evaluation Modules

Layout

Texas Instruments TRF0108SEP/SP Evaluation Modules
Published: 2026-06-25 | Updated: 2026-06-25